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Results 101 - 120 of about 271 publications

N Title Journal or book Year
101 L. I. Ivanenko, G. Behr, J. Schumann, H. Vinzelberg, E. Arushanov, D. Eckert, U. K. Roessler, K.-H. Mueller, C. M. Schneider.
Magnetic and electrical properties of Mn-doped p-type -FeSi2 single crystals
J. Appl. Phys 92 (9), pp.5413-5419 2002
102 L. I. Ivanenko, G. Behr, J. Schumann, E. Arushanov, D. Eckert, K.-H. Mueller, C. M. Schneider, U.K. Rößler.
Magnetic properties of undoped and Co-doped n-type β-FeSi2.5 single crystals
Journal of Materials Research V. 17, N 11, S. 2960-2965 2002
103 The effect of dense compression plasma flow on silicon surface morphology Surface and Coatings Technology Vol.158-159, P.273-276 2002
104 V. E. Borisenko, J. A. Berashevich, N.V. Grib.
Possibilities of DNA molecule for electronic processing of information
Proceedings of the Belorussian Engineering Academy , 1(13)/2, P. 58-61, (in Russian) 2002
105 N. V. Gaponenko.
Synthesis and optical properties of sol-gel films in mesoporous matrices
J. Appl. Spectroscopy V. 69, 1. P. 117 2002
106 D. A. Podryabinkin, A. L. Danilyuk.
Evolution of two-level system in a resonant periodic field (in conditions of measurements)
Proceedings of the Belorussian Engineering Academy 1(11)/3, pp. 66-68. (in Russian) 2001
107 D. A. Podryabinkin, A. L. Danilyuk.
Models of logic spin elements for quantum calculations
Proceedings of the Belorussian Engineering Academy 1(11)/3-pp.69-71 (in Russian) 2001
108 N. V. Gaponenko, A. V. Mudryi, J. C. Pivin, B. Hamilton, V. V. Shushunova.
Photoluminescence of Er-implanted silica, polysiloxane and porous silicon films
Mater. Sci. Eng. B Vol. 6970. P. 215218 2001
109 V. E. Borisenko, R. Kudrawiec, L. Bryja, J. Misiewicz, G. E. Thompson, P. Skeldon, B. Hamilton, J. C. Pivin, E. A. Stepanova, N. V. Gaponenko, O. V. Sergeev, A. P. Stupak.
Terbium photoluminescence in polysiloxane films
Mater. Sci. Eng. B Vol. 81, 1-3. P. 191-193 2001
110 O. V. Sergeev, R. Heiderhoff, J. Misiewicz, G. E. Thompson, E. A. Stepanova, A. V. Mudryi, V. M. Parkun, H. Gnaser, N. V. Gaponenko, L. J. Balk.
Optical and structural characterisation of erbium-doped TiO2 xerogel films processed on porous anodic alumina
J. Electrochem. Soc Vol. 148, 2. P. H13H16 2001
111 N. V. Gaponenko.
Sol-gel derived films in mesoporous matrices: porous silicon, anodic alumina and artificial opals
Synthetic Metals Vol. 124, 1. P. 125130 2001
112 N. V. Gaponenko, S. V. Gaponenko, A. P. Stupak, V. M. Shelekhina, O. A. Prokhorov, P. A. Vityaz.
Towards 3D Photonic Crystals
Synthetic Metals Vol. 124, 1. P. 137139 2001
113 V. E. Borisenko, S. V. Gaponenko, V.S. Gurin.
Physics, Chemistry and Application of Nanostructures
Book World Scientific, Singapore 2001
114 V. E. Borisenko.
Discovery and understanding of nanoworld in the XX th century: main achievements in the mirror of the Nobel Prizes
Physics, Chemistry and Application of Nanostructures pp. 3 14 2001
115 V. E. Borisenko, O. V. Sergeev, R. Heiderhoff, L. J. Balk.
Nanostructured TiO2:Tb2O3 phosphor fabricated by sol gel method on porous anodic alumina
Physics, Chemistry and Application of Nanostructures pp. 210 213 2001
116 V. E. Borisenko, A. L. Danilyuk, J. A. Berashevich, A. N. Kholod.
Charge-carrier transport in nanometer-sized periodic Si/CaF2 structures with participation of traps
Semiconductors 35(1), 112 116 2001
117 V. E. Borisenko, A. N. Kholod, F. Bassani, F. Arnaud d, S. Ménard, M. Liniger, G. Guirleo.
Carrier dynamics modelling in a precharged Si/CaF2 heterostructure
J. Appl. Phys 89(11), 6281-6284 2001
118 V. E. Borisenko, V. L. Shaposhnikov, D. B. Migas, W. Henrion, M. Rebien, L. Miglio, F. Marabelli, B. A. Cook.
Electronic and optical properties of isostructural β FeSi2 and OsSi2
Phys. Rev. B 64(7), 075208-1(-7) 2001
119 V. E. Borisenko, A. N. Kholod, F. Arnaud d, A. Saúl, J. Fuhr.
Appearance of direct gap in silicon and germanium nanosize slabs
Optical Material 17(1), 61-63 2001
120 V. E. Borisenko, V. L. Shaposhnikov, D. B. Migas, W. Henrion, M. Rebien, L. Miglio.
Optical properties of isostructural β FeSi2, OsSi2, Fe0.5Os0.5Si2 and Os0.5Fe0.5Si2
Optical Material 17(1), 335-338 2001
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