| Publication details |
| Name: |
Resonance transfer of charge carriers in Si/CaF2 periodic nanostructures via trap states in insulator layers |
| Journal: |
Semiconductors |
| Detail info: |
36(6), 679-684 |
| Year: |
2002 |
| Authors: |
V. E. Borisenko, A. L. Danilyuk, J. A. Berashevich.
|
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